Optical Metrology

Daniel Aguirre-Aguirre

  • Optical Metrology

  • Optical Testing

  • Optical Engineering

  • Freeform surfaces analysis via null-screen test.
  • Advances in the optical evaluation of unconventional surfaces.
  • Development and characterization of prototypes. PART II.
  • M. Campos-García, D. Aguirre-Aguirre, V. I. Moreno-Oliva, O. Huerta-Carranza, And V. E. Armengol-Cruz, “Measurement and correction of misalignments in corneal topography using the null-screen method,” OSA Continuum, 4(1), 158-170 (2021).
  • D. Aguirre-Aguirre, B. Villalobos-Mendoza, R. Díaz-Uribe, and M. Campos-García, “Null-screen design for highly freeform surfaces testing,” Opt. Express 28(24), 36706-36722 (2020).
  • M. Navarrete, R. Mayen-Mondragon, R. Sato, E. V. Mejía, D. Aguirre-Aguirre, and J. Genesca, “Stability analysis of silver nanoparticle suspensions by cyclic voltammetry,” Appl. Opt. 59, D104-D110 (2020).
  • R. Izazaga, D. Aguirre-Aguirre, B. Villalobos-Mendoza, “Off-axis conic surfaces: Interferogram simulation algorithm and its use in stressed mirror polishing,” Optics & Laser Technology 112, 284-291 (2019).
  • D. Aguirre-Aguirre, M. Campos-García, R. Díaz-Uribe, B. Villalobos-Mendoza, “General equations for the null-screen test for aspherical surfaces with deformation coefficients,” Appl. Opt. 57(35) 10230-10238 (2018).
  • B. Villalobos-Mendoza, D. Aguirre-Aguirre, F. Granados-Agustín, “Study of the factors that affect the correlation behavior during the evaluation of interferograms,” Opt. Eng., Vol. 57(10), (2018).
  • D. Aguirre-Aguirre, E. Carrasco, R. Izazaga-Pérez, G. Páez, F. Granados-Agustín, E. Percino-Zacarías, A. Gil de Paz, J. Gallego, J. Iglesias-Páramo, and B. Villalobos-Mendoza, “MEGARA optics: sub-aperture stitching interferometry for large surfaces”, PASP 130, 045001 (2018).
  • D. Aguirre-Aguirre, R. Díaz-Uribe, M. Campos-García, B. Villalobos-Mendoza, R. Izazaga-Pérez and O. Huerta-Carranza, “Fast conical surfaces evaluation with null-screens and randomized algorithms,” Appl. Opt. 56(5) 1370-1382 (2017).
  • B. Villalobos-Mendoza, F. S. Granados-Agustín, D. Aguirre-Aguirre, A. Cornejo-Rodríguez, “Phase shifting interferometry using a spatial light modulator to measure optical thin films,” Appl. Opt. 54(26) 7997-8003 (2015).


  • Jorge Prado Morales